
8 min
Deep Transfer Learning for Computer Vision
Chip and equipment manufacturing and tracking is a tough task given the strict adherence to quality standards and processes like six-sigma control checks. In this session, we will be looking at key real-world problems from Semiconductor
&
Manufacturing, and possible methodologies where we leveraged a combination of traditional computer vision techniques and coupled it with the power of deep transfer learning and machine \ deep learning. We will be covering two main use-cases from the Industry:
Automatic Defect detection at Nanoscale
Defect Clustering at Nanoscale
&
Manufacturing, and possible methodologies where we leveraged a combination of traditional computer vision techniques and coupled it with the power of deep transfer learning and machine \ deep learning. We will be covering two main use-cases from the Industry:
Automatic Defect detection at Nanoscale
Defect Clustering at Nanoscale