Deep Transfer Learning for Computer Vision


Chip and equipment manufacturing and tracking is a tough task given the strict adherence to quality standards and processes like six-sigma control checks. In this session, we will be looking at key real-world problems from Semiconductor & Manufacturing, and possible methodologies where we leveraged a combination of traditional computer vision techniques and coupled it with the power of deep transfer learning and machine \ deep learning. We will be covering two main use-cases from the Industry:

Automatic Defect detection at Nanoscale

Defect Clustering at Nanoscale

8 min
02 Jul, 2021

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